ETS 2007 - Call for Participation

CALL FOR PARTICIPATION

Registration Deadline Extended to April 19th, 2007!

Scope -- Technical Program -- Tutorials -- Social Event -- Fringe Meetings -- Registration-- Committees

Scope

The IEEE European Test Symposium (ETS) is Europe's premier forum dedicated to presenting and discussing scientific results, emerging ideas, practical applications, hot topics, and new trends in the area of electronic-based circuit and system testing. In 2007, ETS will take place in Freiburg, Southern Germany's Black Forest area. ETS'07 is being organized by the Albert-Ludwigs-University of Freiburg, which celebrates its 550-year anniversary in 2007, and is sponsored by the Test Technology Technical Council (TTTC) of the IEEE Computer Society.

Technical Program

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The ETS’07 program offers the following items:

Two keynote addresses in the plenary opening session
- If It's All About Yield, Why Talk About Testing?
  Rene Segers (NXP Semiconductors, NL)
- Electronics Design-For-Test: Past, Present and Future
  Ben Bennetts (Bennetts Associates, UK)
Paper presentations in three parallel tracks including the following topics:
- Fault and Defect Diagnosis
- Mixed Signal DFT and Test
- NoC Testing
- Advances in RF Test
- Diagnosis and Debug
- Simulation and Verification
- Memory Test
- Delay Faults, IEEE 1500 and IJTAG/SJTAG
- On-Line Testing and Self-Test
- Fault Grading and Test Quality
- Diagnosis and Yield Improvement
- Single Event Upsets
- Delay and Performance Test
Two panel sessions and one special session on hot (test) topics.
Poster sessions.
Vendor Sessions with technical marketing presentations.

Tutorials

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ETS’07 offers two full-day TTEP tutorials on Sunday May 20, 2007.

Practices in Analog, Mixed-Signal, and RF Testing
by Salem Abdennadher (Intel, USA) and Saghir A. Shaikh (Cadence Design Systems, USA).

Statistical Screening Methods targeting "Zero defect" IC Quality and Reliability
by Adit D. Singh (Auburn University, USA).

Social Event

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ETS’07 offers a Social Event in the beautiful surroundings of Freiburg, not far from Black Forest and Vosges. The friendly, inspiring atmosphere of ETS’07 allows plenty of opportunities to meet, network, and interact with your colleagues in an informal setting.

Fringe Meetings

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ETS’07 Fringe Meetings include:

European branch of the IEEE Computer Society Test Technology Technical Council – May 22.
3rd IEEE European Board Test Workshop (EBTW’07) – May 23 - 24.
4th IEEE International Workshop on Silicon Debug and Diagnosis (SDD’07) – May 23 - 24.

Registration

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You are cordially invited to participate in ETS’07. Until April 19, 2007 discount registration is available online via http://ets07.informatik.uni-freiburg.de. Registration includes access to all symposium sessions, coffee breaks, three lunches, welcome reception, Social Event with banquet, Informal Digest of Papers, Formal Proceedings (published by IEEE CS), and post-symposium CD-ROM by mail. Tutorials require a separate registration fee. For more information, check the ETS’07 web site.

Committees

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Organization Committee

General Chair
B. Becker - U. Freiburg (D)

General Vice Chair
M. Sonza Reorda - Polit. di Torino (I)

Finance Chair
I. Polian

Local Arrangements
P. Engelke

Registration
M. Herbstritt

Web
S. Spinner

Accommodation
A. Flashar

Program Committee

Program Chair
Z. Peng - Linköping U. (S)

Program Vice Chair
H.-J. Wunderlich - U. Stuttgart (D)

Industrial Relations Chair
P. Muhmenthaler - Infineon (D)

Publications Chair
C. Landrault - LIRMM (F)

Panel Chair
P. Prinetto - Politecnico di Torino (I)

Tutorial Chair
J. Figueras - UPC Barcelona (E)

Imbedded Tutorial Chair
P. Girard - LIRMM (F)

Regional Liaisons
L. Carro - UFRGS (BR)
A. Singh - Auburn U. (USA)
A. Osseiran - Edith Cowan U. (AUS)
C.-W. Wu - Nat. Tsing-Hua U. (TW)

Topic Chairs
B. Al-Hashimi - U. Southampton (UK)
S. Hellebrand - U. Paderborn (D)
H. Kerkhoff - U. Twente (NL)
E. Larsson - Linköping U. (S)
E.J. Marinissen - NXP Research (NL)
C. Metra - U. Bologna (I)
M. Renovell - LIRMM (F)
J. Tyszer - Poznan Tech. U. (PL)

Members
E.J. Aas - Norw. U. of Science (N)
M. Abadir - Motorola (USA)
R. Aitken - ARM Artisan (USA)
W. Anheier - U. Bremen (D)
F. Azais - LIRMM (F)
L. Balado - U. Polit. de Catalunya (E)
A. Benso - Polit. di Torino (I)
G. Carlsson - Ericsson (S)
K. Chakrabarty - Duke U. (USA)
W. Daehn - HS Magdbg.-Stendal (D)
R. Dorsch - IBM Entw. (D)
M.-L. Flottes - LIRMM (F)
G. Francis - Philips Semiconductors (UK)
H. Fujiwara - NAIST (J)
F. Fummi - U. Verona (I)
D. Gizopoulos - U. Piraeus (GR)
E. Gramatova - Slov. Acad. Sci. (SK)
S. Hamdioui, Delft U. of Tech. (NL)
C. Hill - Mentor Graphics (UK)
M. Hirech - Synopsys (USA)
A. Hlawiczka - Silesian TU. (PL)
M. S. Hsiao - Virginia T. U. (USA)
P. Hughes - ARM (UK)
A. Ivanov - U. British Col. (CAN)
R. Kapur - Synopsys (USA)
S. Kajihara - Kyushu Inst. Tech. (J)
B. Kruseman - Philips Research (NL)
S. Kundu - U. of Massachusetts (USA)
H. Lang - Freescale Semi. (D)
M. Lubaszewski - UFRGS (BR)
Y. Makris - Yale U. (USA)
H. Manhaeve - QStar Test (B)
T. Margaria - U. Göttingen (D)
P. Maxwell - Agilent Tech. (USA)
L. Miclea - U. Cluj-Napoca (RO)
S. Mir - TIMA CMP (F)
Y. Miura - Tokyo Metro. U. (J)
W. Moore - Oxford U. (UK)
N. Nicolici - McMaster U. (CAN)
F. Novak - Jozef Stephan Inst. (SLO)
O. Novak - TU Liberec (CZ)
A. Orailoglu - UCSD (USA)
S. Ozev - Duke U. (USA)
A. Paschalis - U. Athens (GR)
A. Pataricza - Budapest U. TE (H)
F. Poehl - Infineon Techn. (D)
J. Raik - Tallinn U. (EE)
J. Rajski - Mentor Graphics (USA)
A. Richardson, U. Lancaster (UK)
J. Rivoir - Agilent Techn. (D)
C. Robach - ESISAR (F)
P. Rosinger - U. Southampton (UK)
B. Rouzeyre - LIRMM (F)
A. Rueda - CNM (E)
G. Russell - Newcastle U. (UK)
P. Sanchez - U. Cantabria (E)
J. Segura - U. Illes Balears (E)
B. Straube - EAS/IIS FhG (D)
J.-P. Teixeira - IST/INESC (P)
N. Touba - U. of Texas (USA)
R. Ubar - Tallinn U. (EE)
B. Vermeulen - Philips Research (NL)
C. Wegener - U. College Cork (IRL)
M. Zwolinski - U. Southampton (UK)

Steering Committee

Chair
Chair: C. Landrault - LIRMM (F)

Members
B. Al-Hashimi - U. Southampton (UK)
B. Becker - U. Freiburg (D)
J. Figueras - UPC Barcelona (E)
E.J. Marinissen - NXP Research (NL)
P. Muhmenthaler - Infineon (D)
Z. Peng - Linköping U. (S)
P. Prinetto - Politecnico di Torino (I)
M. Renovell - LIRMM (F)
M. Sonza-Reorda - Polit. di Torino (I)
J.-P. Teixeira - IST/INESC (P)
H.-J. Wunderlich - U. Stuttgart (D)
Y. Zorian - Virage Logic (USA)

For more information, visit us on the web at: http://www.ieee-ets.org/

The 12th IEEE European Test Symposium (ETS'07) is organized by the Albert-Ludwigs-University of Freiburg and sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).

TTTC's Electronic Broadcasting Service
	12th IEEE European Test Symposium (ETS'07) May 20-24, 2007 Convention Center, Freiburg, Germany http://www.ieee-ets.org/